Method and article of manufacture to generate IC test vector for synchronized physical probing
US7821276B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 16, 2008 |
| Grant date | Oct 26, 2010 |
| Priority date | — |
| Expiry date | Jul 23, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31813
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems, methods, and computer readable media storing instructions for such methods relate to generating test vectors that can be used for exercising a particular area of interest in an integrated circuit. The test vectors generally include a non-overlapping repeating and/or predictable sequence of care bits (a care bit pattern) that can be used by a tester to cause the exercise of the area and collect emissions caused by exercising the area. Such emissions can be used for analysis and debugging of the circuit and/or a portion of it. Aspects can include providing a synchronization signal that can be used by a tester to allow sensor activation at appropriate times.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.