Thomas Bartenstein
10Patents
5h-index
16Co-inventors
59Inventor score
Filing activity: Dec 18, 2000 → Oct 12, 2010
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6901542B2 | Internal cache for on chip test data storage | Physics | 13 | Expired |
| US7496816B2 | Isolating the location of defects in scan chains | Physics | 11 | Expired |
| US6721914B2 | Diagnosis of combinational logic circuit failures | Physics | 10 | Expired |
| US6708306B2 | Method for diagnosing failures using invariant analysis | Physics | 8 | Expired |
| US8190953B2 | Method and system for selecting test vectors in statistical volume diagnosis using failed test data | Physics | 5 | Active |
| US6675323B2 | Incremental fault dictionary | Physics | 4 | Expired |
| US7821276B2 | Method and article of manufacture to generate IC test vector for synchronized physical probing | Physics | 3 | Active |
| US8397113B2 | Method and system for identifying power defects using test pattern switching activity | Physics | 2 | Active |
| US8402421B2 | Method and system for subnet defect diagnostics through fault compositing | Physics | 2 | Active |
| US8120378B2 | System to control insertion of care-bits in an IC test vector improved optical probing | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.