Performing early DFT-aware prototyping of a design
US7853905B1 · kind B1 · utility
3Cited by
3References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 27, 2007 |
| Grant date | Dec 14, 2010 |
| Priority date | — |
| Expiry date | Oct 19, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/30
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention relates to performing early design for testing (DFT)-aware prototyping of a design. Unlike prior approaches, the improvement analyzes and considers the impact of test structures at a very early stage of the design process. This allows test structures to be considered and addressed in a more efficient iterative and incremental way, which reduces design cycle time and reduces costs.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.