Patent · US Active

System and method for generating at-speed structural tests to improve process and environmental parameter space coverage

US7856607B2 · kind B2 · utility

7Cited by
11References
25Claims
0Family size

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Key dates

Filing dateNov 2, 2007
Grant dateDec 21, 2010
Priority date
Expiry dateFeb 24, 2029

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31835
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A system for enhancing the practicability of at-speed structural testing (ASST). In one embodiment, the system includes first means for performing statistical timing analysis on a design of logic circuitry. A second means performs a criticality analysis on the logic circuitry as a function of the statistical timing analysis so as to determine a criticality probability for each node of the logic circuitry. A third means selects nodes of the logic circuitry as a function of the criticality analysis. A fourth means selects timing paths as a function of the criticality probabilities of the selected nodes. A fifth means generates an ASST pattern for each of the selected timing paths. A sixth mean is provided to perform ASST on a fabricated instantiation of the design at functional speed using the generated ASST pattern.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.