Patent · US Active

Data retention monitor

US7864565B2 · kind B2 · utility

5Cited by

6References

10Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Thomas Nirschl · Putzbrunn, DE
Jan Otterstedt · Unterhaching, DE
Christian Peters · Mountain View, US
Michael Bollu · Munich, DE
Wolf Allers · Munich, DE
Michael Sommer · Raubling, DE

Key dates

Filing date	Jul 31, 2007
Grant date	Jan 4, 2011
Priority date	—
Expiry date	Oct 24, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG11C16/349
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A data retention monitor for a memory cell including a voltage source and a voltage comparator. The voltage source is adapted to provide a selectable voltage to the memory cell. The selectable voltage includes a read voltage and a test voltage, with the test voltage being greater than the read voltage. The voltage comparator is adapted to compare a voltage of the memory cell with a reference voltage after the provision of the selectable voltage to the memory cell. The memory cell retains data when the memory cell voltage generated at least in part by the test voltage is substantially equal to the reference voltage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.