Integrated circuit including a first gate stack and a second gate stack and a method of manufacturing
US7875516B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 14, 2007 |
| Grant date | Jan 25, 2011 |
| Priority date | — |
| Expiry date | Mar 23, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D84/038
Abstract
An integrated circuit including a first gate stack and a second gate stack and a method of manufacturing is disclosed. One embodiment provides non-volatile memory cells including a first gate stack and a gate dielectric on a first surface section of a main surface of a semiconductor substrate, and a second gate stack including a memory layer stack on a second surface section. A first pattern is transferred into the first gate stack and a second pattern into the second gate stack.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.