Patent · US Active

Integrated circuit including a first gate stack and a second gate stack and a method of manufacturing

US7875516B2 · kind B2 · utility

11Cited by
5References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 14, 2007
Grant dateJan 25, 2011
Priority date
Expiry dateMar 23, 2029

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/038

Abstract

An integrated circuit including a first gate stack and a second gate stack and a method of manufacturing is disclosed. One embodiment provides non-volatile memory cells including a first gate stack and a gate dielectric on a first surface section of a main surface of a semiconductor substrate, and a second gate stack including a memory layer stack on a second surface section. A first pattern is transferred into the first gate stack and a second pattern into the second gate stack.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.