Patent · US Active

Probe card layout

US7884629B2 · kind B2 · utility

0Cited by

14References

11Claims

0Family size

Assignee

Micron Technology, Inc. · US

Inventor

John Caldwell · Meridian, US

Key dates

Filing date	Jul 30, 2009
Grant date	Feb 8, 2011
Priority date	—
Expiry date	Jul 30, 2029

Classification

Technology area (CPC G)Physics
CPC primaryG01R1/06733
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Multi-touchdown, parallel test probe cards having probe elements arranged to provide greater efficiency during testing of a substrate having a plurality of die thereon. Probe elements may be arranged in a number of configurations that allow for efficient usage of the probe elements.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.