Patent · US Active

Post-CMP cleaning compositions and methods of using same

US7919446B1 · kind B1 · utility

4Cited by
0References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 26, 2008
Grant dateApr 5, 2011
Priority date
Expiry dateJun 29, 2029

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC11D2111/22
  • WIPO fieldBasic materials chemistry
  • WIPO sectorChemistry

Abstract

Compositions comprise a purine compound; an alcohol amine; a quaternary ammonium salt; an amino acid, and optionally an antioxidant. The compositions are useful in post-CMP cleaning processes. One particular advantage of these compositions is that they can effectively remove slurry contamination without increasing the roughness of the copper surface.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.