Post-CMP cleaning compositions and methods of using same
US7919446B1 · kind B1 · utility
4Cited by
0References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 26, 2008 |
| Grant date | Apr 5, 2011 |
| Priority date | — |
| Expiry date | Jun 29, 2029 |
Classification
- Technology area (CPC C)Chemistry; Metallurgy
- CPC primaryC11D2111/22
- WIPO fieldBasic materials chemistry
- WIPO sectorChemistry
Abstract
Compositions comprise a purine compound; an alcohol amine; a quaternary ammonium salt; an amino acid, and optionally an antioxidant. The compositions are useful in post-CMP cleaning processes. One particular advantage of these compositions is that they can effectively remove slurry contamination without increasing the roughness of the copper surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.