Patent · US Expired

Method and apparatus for treating a semi-conductor substrate

US7923383B2 · kind B2 · utility

1Cited by
14References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 28, 2003
Grant dateApr 12, 2011
Priority date
Expiry dateApr 3, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/02164
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

This invention relates to a method of treating a semiconductor wafer and in particular, but not exclusively, to planarisation. The method consists of depositing a liquid short-chain polymer formed from a silicon containing bas or vapour. Subsequently water and OH are removed and the layer is stabilised.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.