Selective threshold voltage verification and compaction
US7924617B2 · kind B2 · utility
11Cited by
27References
22Claims
0Family size
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Key dates
| Filing date | Aug 25, 2009 |
| Grant date | Apr 12, 2011 |
| Priority date | — |
| Expiry date | Aug 25, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C16/3445
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Non-volatile memory devices for providing selective compaction verification and/or selective compaction to facilitate a tightening of the distribution of threshold voltages in memory devices utilizing a NAND architecture. By providing for compaction verification and/or compaction on less than all word lines of a NAND string, increased tightening of the distribution may be achieved over prior methods performed concurrently on all word lines of a NAND string.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.