Ranged fault signatures for fault diagnosis
US7934125B2 · kind B2 · utility
5Cited by
20References
22Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 19, 2007 |
| Grant date | Apr 26, 2011 |
| Priority date | — |
| Expiry date | Apr 19, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B23/0281
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
Process data is analyzed, the process data having been generated during a manufacturing process to detect a fault. One or more process variables of the manufacturing process that contributed to the fault are determined. A relative contribution of each of the one or more process variables to the fault is determined. A fault signature having relative contribution ranges for at least one of the one or more process variables is generated, the relative contribution ranges based on the determined relative contributions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.