Method for controlling warpage in redistributed chip packaging panels
US7950144B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 30, 2008 |
| Grant date | May 31, 2011 |
| Priority date | — |
| Expiry date | Sep 14, 2029 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/49171
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A method is disclosed for controlling warpage in an integrated electronic panel assembly including a plurality of die embedded within an encapsulant. The method comprises determining a number of build-up layers required for the integrated panel assembly. Each build-up layer contributes an amount of concavity to the integrated electronic panel assembly. A level of global convex warpage on the integrated panel assembly is then predicted, wherein the global convex warpage is provided by the presence of an embedded ground plane (EGP) alone within the integrated panel assembly and in the absence of any build-up layers. The embedded ground plane includes openings therein for accepting at least one die within a corresponding opening and it contributes a fixed amount of global convex warpage. An amount of local convex warpage to be introduced into the integrated electronic panel assembly is then determined, which together with the fixed amount of global convex warpage provides a combined convex warpage to the integrated electronic panel assembly. Accordingly, the global and local convex warpage counteract the concavity to be introduced subsequently by a build-up layer processing and is suf…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.