Patent · US Active

Wafer and method of producing the same

US7951716B2 · kind B2 · utility

0Cited by
4References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 16, 2007
Grant dateMay 31, 2011
Priority date
Expiry dateFeb 11, 2029

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24D13/147
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A wafer is produced at a step of polishing a predetermined face of a wafer to flatten the predetermined face while supplying a polishing liquid onto a bonded abrasive cloth, wherein the bonded abrasive cloth comprises a urethane bonding material consisting of a soft segment having a polyfunctional isocyanate and a hard segment having a polyfunctional polyol and having an expansion ratio of 1.1-4 times and silica having an average particle size of 0.2-10 μm and a hydroxy group, and has a given ratio of the hard segment occupied in the urethane bonding material, a given volume ratio of silica and a given Shore D hardness.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.