Patent · US Active

Film formation apparatus for semiconductor process and method for using same

US7964516B2 · kind B2 · utility

5Cited by
2References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 10, 2009
Grant dateJun 21, 2011
Priority date
Expiry dateAug 19, 2029

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/905
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

A method for using a film formation apparatus includes, in order to inhibit metal contamination: performing a cleaning process using a cleaning gas on an inner wall of a process container and a surface of a holder with no productive target objects held thereon; and then, performing a coating process of forming a silicon nitride film by alternately supplying a silicon source gas and a nitriding gas to cover with the silicon nitride film the inner wall of the process container and the surface of the holder with no productive target objects held thereon.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.