Inventor · Nirasaki, JP

Yamato Tonegawa

17Patents
5h-index
23Co-inventors
66Inventor score

Filing activity: Mar 19, 2002 → Jan 20, 2022

Most-cited inventions

PatentTitleAreaCited byStatus
US8034673B2 Film formation method and apparatus for forming silicon-containing insulating film doped with metal Electricity 71 Active
US7179334B2 System and method for performing semiconductor processing on substrate being processed Emerging Cross-Sectional Technologies 7 Expired
US7494943B2 Method for using film formation apparatus Emerging Cross-Sectional Technologies 6 Active
US10388511B2 Method of forming silicon nitride film, film forming apparatus and storage medium Electricity 6 Active
US7964516B2 Film formation apparatus for semiconductor process and method for using same Emerging Cross-Sectional Technologies 5 Active
US8080109B2 Film formation apparatus and method for using the same Emerging Cross-Sectional Technologies 4 Active
US7938080B2 Method for using film formation apparatus Emerging Cross-Sectional Technologies 4 Active
US11694890B2 Substrate processing method and substrate processing apparatus Electricity 1 Active
US10535501B2 Film forming apparatus, film forming method and non-transitory storage medium Electricity 1 Active
US7959737B2 Film formation apparatus and method for using the same Emerging Cross-Sectional Technologies 0 Active
US10217630B2 Method of forming silicon-containing film Electricity 0 Active
US12060640B2 Film forming method and system Electricity 0 Active
US12237167B2 Deposition method Electricity 0 Active
US10573514B2 Method of forming silicon-containing film Electricity 0 Active
US8153451B2 System and method for performing semiconductor processing on target substrate Emerging Cross-Sectional Technologies 0 Active
US11923177B2 Plasma processing apparatus and plasma processing method Electricity 0 Active
US11781219B2 Processing apparatus and processing method Chemistry; Metallurgy 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.