Patent · US Active

Method for providing a probe for a probe-microscopic analysis of a test sample in a probe microscope and arrangement with a probe microscope

US7971266B2 · kind B2 · utility

0Cited by

4References

28Claims

0Family size

Assignee

JPK INSTRUMENTS AG · DE

Inventors

Torsten Jähnke · Berlin, DE
Torsten Müller · Berlin, DE
Detlef Knebel · Berlin, DE
Kathryn Anne Poole · Berlin, DE

Key dates

Filing date	Jan 16, 2009
Grant date	Jun 28, 2011
Priority date	—
Expiry date	Dec 17, 2029

Classification

Technology area (CPC B)Performing Operations; Transporting
CPC primaryB82Y35/00
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The present invention relates to a method for providing a measuring probe (1, 1a, 2) for a probe microscopic examination of a sample in a probe microscope, in particular a scanning probe microscope, in which the measuring probe (1), which has a probe base (1a) and a probe extension (2) formed thereon, is held on a carrier device and the measuring probe (1) is processed before or after a measurement by detaching a section of the probe extension (2). The invention further relates to an arrangement having a probe microscope for the probe microscopic examination of a sample, in particular a scanning probe microscope.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.