Torsten Jähnke
11Patents
2h-index
8Co-inventors
43Inventor score
Filing activity: Sep 24, 2002 → Nov 30, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7022985B2 | Apparatus and method for a scanning probe microscope | Emerging Cross-Sectional Technologies | 101 | Expired |
| US8381311B2 | Method for examining a test sample using a scanning probe microscope, measurement system and a measuring probe system | Physics | 3 | Active |
| US8368017B2 | Method for the operation of a measurement system with a scanning probe microscope and a measurement system | Physics | 2 | Active |
| US7473894B2 | Apparatus and method for a scanning probe microscope | Emerging Cross-Sectional Technologies | 1 | Active |
| US9080937B2 | Apparatus and a method for investigating a sample by means of several investigation methods | Physics | 0 | Active |
| US8898809B2 | Method and apparatus for the combined analysis of a sample with objects to be analyzed | Physics | 0 | Active |
| US7934323B2 | Method and a device for the positioning of a displaceable component in an examining system | Physics | 0 | Active |
| US8769711B2 | Method for examining a measurement object, and apparatus | Physics | 0 | Active |
| US7971266B2 | Method for providing a probe for a probe-microscopic analysis of a test sample in a probe microscope and arrangement with a probe microscope | Performing Operations; Transporting | 0 | Active |
| US10539591B2 | Measuring device for a scanning probe microscope, scanning probe microscope and method for operating the scanning probe microscope | Physics | 0 | Active |
| US8505109B2 | Measuring probe device for a probe microscope, measuring cell and scanning probe microscope | Performing Operations; Transporting | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.