Processing multilayer semiconductors with multiple heat sources
US7986871B2 · kind B2 · utility
1Cited by
21References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 17, 2008 |
| Grant date | Jul 26, 2011 |
| Priority date | — |
| Expiry date | Mar 18, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/67103
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A method of adjusting the heat transfer properties within a processing chamber is presented. Chamber properties may be determined and adjusted by adjusting the thermal mass of an edge ring disposed in the processing chamber.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.