Patent · US Active

Lower liner with integrated flow equalizer and improved conductance

US7987814B2 · kind B2 · utility

18Cited by
19References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 7, 2008
Grant dateAug 2, 2011
Priority date
Expiry dateJul 5, 2029

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T428/13
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A plasma processing chamber has a lower liner with an integrated flow equalizer. In an etching process, the processing gases may be unevenly drawn from the processing chamber which may cause an uneven etching of the substrate. The integrated flow equalizer is configured to equalize the flow of the processing gases evacuated from the chamber via the lower liner.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.