Patent · US Active

Method for fabricating self-aligned nanostructure using self-assembly block copolymers, and structures fabricated therefrom

US7993816B2 · kind B2 · utility

9Cited by
1References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 17, 2008
Grant dateAug 9, 2011
Priority date
Expiry dateMar 4, 2030

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/0002
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

In one embodiment, the present invention provides a method for patterning a surface that includes forming a block copolymer atop a heterogeneous reflectivity surface, wherein the block copolymer is segregated into first and second units; applying a radiation to the first units and second units, wherein the heterogeneous reflectivity surface produces an exposed portion of the first units and the second units; and applying a development cycle to selectively remove at least one of the exposed first and second units of the segregated copolymer film to provide a pattern.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.