Computer-implemented methods, carrier media, and systems for determining sizes of defects detected on a wafer
US8000905B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 14, 2007 |
| Grant date | Aug 16, 2011 |
| Priority date | — |
| Expiry date | Apr 29, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/8854
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Computer-implemented methods, carrier media, and systems for determining sizes of defects detected on a wafer are provided. One computer-implemented method includes separating the defects into groups based on output acquired for the defects by multiple channels of an inspection system used to detect the defects on the wafer. The method also includes separating the defects in one or more of the groups into subgroups based on the output acquired for the defects by one or more of the multiple channels. In addition, the method includes determining the sizes of one or more of the defects in one or more of the subgroups separately based on the output acquired for the defects by only one of the multiple channels and a calibration parameter. The calibration parameter is different for each of the subgroups and is acquired by using another system to measure actual sizes of defects detected on other wafers.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.