Stephanie Chen
8Patents
4h-index
20Co-inventors
53Inventor score
Filing activity: Sep 14, 2007 → Nov 24, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8775101B2 | Detecting defects on a wafer | Physics | 64 | Active |
| US8135204B1 | Computer-implemented methods, carrier media, and systems for creating a defect sample for use in selecting one or more parameters of an inspection recipe | Physics | 20 | Active |
| US8000922B2 | Methods and systems for generating information to be used for selecting values for one or more parameters of a detection algorithm | Physics | 11 | Active |
| US8000905B1 | Computer-implemented methods, carrier media, and systems for determining sizes of defects detected on a wafer | Physics | 4 | Active |
| US8831334B2 | Segmentation for wafer inspection | Physics | 4 | Active |
| US9715725B2 | Context-based inspection for dark field inspection | Physics | 3 | Active |
| US8049877B2 | Computer-implemented methods, carrier media, and systems for selecting polarization settings for an inspection system | Physics | 1 | Active |
| US12050408B2 | Optimization-based image processing for metrology | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.