Efficient method and computer program for modeling and improving static memory performance across process variations and environmental conditions
US8001493B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 27, 2008 |
| Grant date | Aug 16, 2011 |
| Priority date | — |
| Expiry date | Oct 17, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2111/08
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An efficient method and computer program for modeling and improving stating memory performance across process variations and environmental conditions provides a mechanism for raising the performance of memory arrays beyond present levels/yields. Statistical (Monte-Carlo) analyses of subsets of circuit parameters are performed for each of several memory performance variables and then sensitivities of each performance variable to each of the circuit parameters are determined. The memory cell design parameters and/or operating conditions of the memory cells are then adjusted in conformity with the sensitivities, resulting in improved memory yield and/or performance. Once a performance level is attained, the sensitivities can then be used to alter the probability distributions of the performance variables to achieve a higher yield. Multiple cell designs can be compared for performance, yield and sensitivity of performance variables to circuit parameters over particular environmental conditions in order to select the best cell design.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.