Patent · US Active

Wafer system with partial cuts

US8017502B2 · kind B2 · utility

2Cited by
5References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 22, 2006
Grant dateSep 13, 2011
Priority date
Expiry dateJul 18, 2027

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/78
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A wafer system is provided including providing a wafer having a topside and a backside, forming a partial cut from the topside of the wafer within a wafer rim and thinning the wafer from the backside for exposing the partial cut at the backside within the wafer rim.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.