Patent · US Active

Film formation apparatus for semiconductor process and method for using the same

US8025931B2 · kind B2 · utility

3Cited by
1References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 11, 2007
Grant dateSep 27, 2011
Priority date
Expiry dateFeb 26, 2029

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC23C16/4405
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

A method for using a film formation apparatus performs a first film formation process, while supplying a first film formation gas into a process field inside a process container, thereby forming a first thin film on a first target substrate inside the process field. After unloading the first target substrate from the process container, the method performs a cleaning process of an interior of the process container, while supplying a cleaning gas into the process field, and generating plasma of the cleaning gas by an exciting mechanism. Then, the method performs a second film formation process, while supplying a second film formation gas into the process field, thereby forming a second thin film on a target substrate inside the process field. The second film formation process is a plasma film formation process that generates plasma of the second film formation gas by the exciting mechanism.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.