Internal voltage level shifting for screening cold or hot temperature defects using room temperature testing
US8030954B1 · kind B1 · utility
0Cited by
3References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 14, 2009 |
| Grant date | Oct 4, 2011 |
| Priority date | — |
| Expiry date | May 1, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2879
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Operation of an internal voltage supply level (Vgg) of an IC is characterized over operating temperature or at a selected temperature to determine a temperature-equivalent internal voltage level. The internal voltage supply of the IC is set to the temperature-equivalent level, and the IC is tested at room temperature to screen for low-temperature defects or high-temperature defects.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.