Patent · US Active

Plasma processing apparatus

US8043471B2 · kind B2 · utility

0Cited by
8References
24Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMar 30, 2007
Grant dateOct 25, 2011
Priority date
Expiry dateMar 16, 2030

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/3244
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

A plasma processing apparatus includes a processing chamber; a plasma generating unit for generating a plasma of a gas supplied into the processing chamber; a substrate mounting table, disposed in the processing chamber, for mounting a semiconductor substrate having a surface on which an etching and/or a film forming process is to be performed. The apparatus further includes a metal member disposed in the processing chamber and to be etched by the plasma generated in the processing chamber to release a precursor of a film to be formed by the film forming process into the processing chamber; a gas supply unit for supplying a first and a second gas into the processing chamber, wherein the second gas which includes halogen atoms and is different from the first gas; a first and a second wiring for supplying high frequency power to the metal member and the substrate mounting table, respectively.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.