Word line driving circuit, semiconductor memory device including the same, and method for testing the semiconductor memory device
US8045394B2 · kind B2 · utility
6Cited by
7References
22Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 28, 2007 |
| Grant date | Oct 25, 2011 |
| Priority date | — |
| Expiry date | Feb 22, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/1202
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A semiconductor memory device in accordance with the present invention is able to facilitate detecting whether a word line fails or not by floating the word line. The semiconductor memory device includes a word line driver, and a floating controller. The word line driver is configured to control a word line to be enabled/disabled. The floating controller is configured to control the word line driver to float the word line in response to a word line floating signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.