Patent · US Active

Process for producing a III-N bulk crystal and a free-standing III-N substrate, and III-N bulk crystal and free-standing III-N substrate

US8048224B2 · kind B2 · utility

2Cited by
4References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 7, 2007
Grant dateNov 1, 2011
Priority date
Expiry dateApr 7, 2028

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T117/1008
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

Embodiments of the invention relate to a process for producing a III-N bulk crystal, wherein III denotes at least one element selected from group III of the periodic system, selected from Al, Ga and In, wherein the III-N bulk crystal is grown by vapor phase epitaxy on a substrate, and wherein the growth rate is measured in real-time. By actively measuring and controlling the growth rate in situ, i.e. during the epitaxial growth, the actual growth rate can be maintained essentially constant. In this manner, III-N bulk crystals and individualized III-N single crystal substrates separated therefrom, which respectively have excellent crystal quality both in the growth direction and in the growth plane perpendicular thereto, can be obtained.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.