Method for producing a wafer comprising a silicon single crystal substrate having a front and a back side and a layer of SiGe deposited on the front side
US8093143B2 · kind B2 · utility
4Cited by
1References
6Claims
0Family size
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Key dates
| Filing date | Mar 16, 2010 |
| Grant date | Jan 10, 2012 |
| Priority date | — |
| Expiry date | Jul 27, 2030 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S438/933
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A method for producing a wafer with a silicon single crystal substrate having a front and a back side and a layer of SiGe deposited on the front side, the method using steps in the following order:
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.