Patent · US Active

Scalable quantum well device and method for manufacturing the same

US8119488B2 · kind B2 · utility

9Cited by
1References
20Claims
0Family size

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Key dates

Filing dateFeb 24, 2011
Grant dateFeb 21, 2012
Priority date
Expiry dateFeb 24, 2031

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D62/8503

Abstract

A quantum well device and a method for manufacturing the same are disclosed. In one aspect, the device includes a quantum well region overlying a substrate, a gate region overlying a portion of the quantum well region, a source and drain region adjacent to the gate region. The quantum well region includes a buffer structure overlying the substrate and including semiconductor material having a first band gap, a channel structure overlying the buffer structure including a semiconductor material having a second band gap, and a barrier layer overlying the channel structure and including an un-doped semiconductor material having a third band gap. The first and third band gap are wider than the second band gap. Each of the source and drain region is self-aligned to the gate region and includes a semiconductor material having a doped region and a fourth band gap wider than the second band gap.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.