Method of performing timing analysis on integrated circuit chips with consideration of process variations
US8141025B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 15, 2009 |
| Grant date | Mar 20, 2012 |
| Priority date | — |
| Expiry date | May 29, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/3312
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for verifying whether a circuit meets timing constraints by performing an incremental static timing analysis in which slack is represented by a distribution that includes sensitivities to various process variables. The slack at an endpoint is computed by propagating the arrival times and required arrival times of paths leading up to the endpoint. The computation of arrival and required arrival times needs the computation of delays of individual gate and wire segments in each path that leads to the endpoint. The mixed mode adds a deterministic timing to the statistical timing (DSTA+SSTA).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.