Patent · US Active

Method of performing timing analysis on integrated circuit chips with consideration of process variations

US8141025B2 · kind B2 · utility

6Cited by
3References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 15, 2009
Grant dateMar 20, 2012
Priority date
Expiry dateMay 29, 2030

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/3312
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for verifying whether a circuit meets timing constraints by performing an incremental static timing analysis in which slack is represented by a distribution that includes sensitivities to various process variables. The slack at an endpoint is computed by propagating the arrival times and required arrival times of paths leading up to the endpoint. The computation of arrival and required arrival times needs the computation of delays of individual gate and wire segments in each path that leads to the endpoint. The mixed mode adds a deterministic timing to the statistical timing (DSTA+SSTA).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.