Patent · US Active

Process for forming a silicon-based single-crystal portion

US8158495B2 · kind B2 · utility

2Cited by
8References
25Claims
0Family size

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Key dates

Filing dateApr 18, 2007
Grant dateApr 17, 2012
Priority date
Expiry dateAug 14, 2027

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/0262
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Silicon-based single-crystal portions are produced on a surface of a substrate, selectively in zones where a single-crystal material is initially exposed. To do this, a layer is firstly formed over the entire surface of the substrate, using a silicon precursor of the non-chlorinated hydride type, and under suitable conditions so that the layer is a single-crystal layer in the zones of the substrate where a single-crystal material is initially exposed and amorphous outside these zones. The amorphous portions of the layer are then selectively etched so that only the single-crystal portions of the layer remain on the substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.