Test method and program product used therefor
US8185339B2 · kind B2 · utility
1Cited by
0References
4Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Nov 26, 2008 |
| Grant date | May 22, 2012 |
| Priority date | — |
| Expiry date | May 18, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3172
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The testing method of the present invention for testing a plurality of devices under test connected to a test module includes (a) determining combinations of devices under test that can theoretically be measured simultaneously from among the combinations of the plurality of devices under test based on at least the connection relationship between the test module and the plurality of devices under test. The testing method further includes (b) testing the plurality of devices under test by sequentially selecting the combinations of devices under test to be actually measured simultaneously from the combinations determined in (a).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.