Semiconductor devices including a through-substrate conductive member with an exposed end and methods of manufacturing such semiconductor devices
US8193092B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jul 31, 2007 |
| Grant date | Jun 5, 2012 |
| Priority date | — |
| Expiry date | Dec 27, 2028 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/14
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
Semiconductor devices and methods of manufacturing semiconductor devices. One example of a method of fabricating a semiconductor device comprises forming a conductive feature extending through a semiconductor substrate such that the conductive feature has a first end and a second end opposite the first end, and wherein the second end projects outwardly from a surface of the substrate. The method can further include forming a dielectric layer over the surface of the substrate and the second end of the conductive feature such that the dielectric layer has an original thickness. The method can also include removing a portion of the dielectric layer to an intermediate depth less than the original thickness such that at least a portion of the second end of the conductive feature is exposed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.