Patent · US Active

Plasma stabilization method and plasma apparatus

US8216421B2 · kind B2 · utility

4Cited by
5References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 5, 2007
Grant dateJul 10, 2012
Priority date
Expiry dateJul 30, 2028

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/321
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A plasma technique in which a plasma generation technique frequently used in various fields including a semiconductor manufacturing process is used, and generation of plasma instability (high-speed impedance change of a plasma) can efficiently be suppressed and controlled in order to manufacture stable products. In a method of disposing an object in a chamber and generating the plasma to treat the object, the chamber is sealed by a surrounding member so as to have an inner space, with at least a part of the member including a dielectric material, an RF induction coil is disposed outside the dielectric member, and a direct-current electric field is supplied into the inner space by a method of passing a direct current through the RF induction coil or another method, so that the plasma is stabilized.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.