Remote plasma processing of interface surfaces
US8217513B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 2, 2011 |
| Grant date | Jul 10, 2012 |
| Priority date | — |
| Expiry date | Feb 2, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/0002
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
Embodiments related to the cleaning of interface surfaces in a semiconductor wafer fabrication process via remote plasma processing are disclosed herein. For example, in one disclosed embodiment, a semiconductor processing apparatus includes a processing chamber, a load lock coupled to the processing chamber via a transfer port, a wafer pedestal disposed in the load lock and configured to support a wafer in the load lock, a remote plasma source configured to provide a remote plasma to the load lock, and an ion filter disposed between the remote plasma source and the wafer pedestal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.