Semiconductor devices with stable and controlled avalanche characteristics and methods of fabricating the same
US8227855B2 · kind B2 · utility
1Cited by
184References
35Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 9, 2009 |
| Grant date | Jul 24, 2012 |
| Priority date | — |
| Expiry date | Jan 28, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D62/108
Abstract
Disclosed are semiconductor devices with breakdown voltages that are more controlled and stable after repeated exposure to breakdown conditions than prior art devices. The disclosed devices can be used to provide secondary circuit functions not previously contemplated by the prior art.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.