Method for detecting flash program failures
US8250417B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 14, 2009 |
| Grant date | Aug 21, 2012 |
| Priority date | — |
| Expiry date | Jun 24, 2031 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/49002
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
One or more techniques are provided for programming a flash memory device. In one embodiment, the memory device is programmed such that a data pattern written to a page in the memory device has encoded therein an expected count value corresponding to the number of times a first binary value occurs in the data pattern. The data pattern includes the program data and the expected count value, and is written to the page in a single operation. The expected count value may be stored in a count field in the management area of the page. During a page read operation, the expected count value is compared to the actual count of the number of bits having the first binary value in the data area of the page. If the expected count is equal to the actual count, then the program data is determined to be valid.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.