Holger Proehl
5Patents
2h-index
7Co-inventors
36Inventor score
Filing activity: Apr 10, 2006 → Jan 12, 2012
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8259294B2 | Method and device for measuring optical characteristic variables of transparent, scattering measurement objects | Physics | 4 | Active |
| US8119194B2 | Infrared reflecting layer system for transparent substrate | Emerging Cross-Sectional Technologies | 3 | Active |
| US8072607B2 | Measuring device for measuring optical properties of transparent substrates | Physics | 1 | Active |
| US7443518B2 | Measuring instrument, in particular for transmission measurement in vacuum system | Physics | 0 | Expired |
| US8377578B2 | Infrared reflecting layer system for transparent substrate | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.