Patent · US Active

Film formation method and film formation apparatus

US8277889B2 · kind B2 · utility

1Cited by
8References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 19, 2008
Grant dateOct 2, 2012
Priority date
Expiry dateDec 23, 2029

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/76873
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

A film formation method is disclosed for depositing a metal film on a target substrate by supplying a metal carbonyl source in gas phase to a surface of the target substrate and decomposing the source near the surface of the target substrate. The method includes a step of preferentially decomposing the metal carbonyl source in an area near the outer peripheral portion of the target substrate when the metal film is being deposited on the surface of the target substrate. As a result, a CO concentration in the atmosphere is increased locally near the outer peripheral portion of the target substrate and the depositing of the metal film on the outer peripheral portion is better controlled.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.