Patent · US Active

High throughput chemical mechanical polishing system

US8308529B2 · kind B2 · utility

41Cited by
12References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 21, 2009
Grant dateNov 13, 2012
Priority date
Expiry dateDec 3, 2030

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B41/005
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

Embodiments of a system and method for polishing substrates are provided. In one embodiment, a polishing system is provided that includes a polishing module, a cleaner and a robot. The robot has a range of motion sufficient to transfer substrates between the polishing module and cleaner. The polishing module includes at least two polishing stations, at least one load cup and at least four polishing heads. The polishing heads are configured to move independently between the at least two polishing stations and the at least one load cup.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.