Patent · US Active

Resist pattern swelling material, and method for patterning using same

US8334091B2 · kind B2 · utility

6Cited by
13References
15Claims
0Family size

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Key dates

Filing dateJun 25, 2008
Grant dateDec 18, 2012
Priority date
Expiry dateJun 25, 2028

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/095
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

To provide a method for easily forming microscopic patterns exceeding the limit of exposure in the patterning technique utilizing the photolithography method in the vacuum deep ultraviolet ray region, a resist pattern swelling material is comprised by mixing a water-soluble or alkali-soluble composition comprising a resin and a cross linking agent and any one of a non-ionic interfacial active agent and an organic solvent selected from a group of the alcohol based, chain or cyclic ester based, ketone based, chain or cyclic ether based organic solvents.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.