Patent · US Active

Monitoring a process sector in a production facility

US8340800B2 · kind B2 · utility

1Cited by
2References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 17, 2008
Grant dateDec 25, 2012
Priority date
Expiry dateJul 3, 2030

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02P90/02
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

Monitoring a process sector in a production facility includes establishing a tool defect index associated with a process sector in the production facility. The tool defect index includes a signal representing a defect factor associated with a tool in the process sector. Monitoring the process also requires determining whether the defect factor is a known defect factor or an unknown defect factor, and analyzing a unit from the tool if the defect factor is an unknown defect factor. Monitoring the process further requires identifying at least one defect on the unit from the tool, establishing that the at least one defect is a significant defect, determining cause of the significant defect, and creating an alert indicating that the tool associated with the process sector is producing units having significant defects.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.