System and method for efficient detection and restoration of data storage array defects
US8352781B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 6, 2009 |
| Grant date | Jan 8, 2013 |
| Priority date | — |
| Expiry date | Nov 17, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/0411
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The system and method are for efficient detection and restoration of data storage array defects. The system may include a data storage subsystem, wherein the data storage subsystem includes a data storage array, read-write logic coupled to the data storage array, a parity generator for producing and storing check data during write operations to the data storage array and generating check data during read operations on the data storage array, and a parity checker for verifying the stored check data with generated check data and identifying defective data read-write elements during read operations on the data storage array. The subsystem may further include a Built-in Self Test (BIST) generator operating only on the identified defective data read-write elements for determining defective data storage elements in the defective data read-write elements, and a restoration mechanism for restoring the valid operation of data access elements containing the defective data storage elements in the data storage array.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.