Akhil Garg
13Patents
3h-index
19Co-inventors
53Inventor score
Filing activity: Nov 28, 2006 → Jun 27, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7954017B2 | Multiple embedded memories and testing components for the same | Physics | 6 | Active |
| US8108744B2 | Locally synchronous shared BIST architecture for testing embedded memories with asynchronous interfaces | Physics | 6 | Active |
| US8386864B2 | Locally synchronous shared BIST architecture for testing embedded memories with asynchronous interfaces | Physics | 4 | Active |
| US10222417B1 | Securing access to integrated circuit scan mode and data | Electricity | 3 | Active |
| US8381051B2 | Testing of multi-clock domains | Physics | 3 | Active |
| US8527824B2 | Testing of multi-clock domains | Physics | 3 | Active |
| US8352781B2 | System and method for efficient detection and restoration of data storage array defects | Physics | 2 | Active |
| US11320485B1 | Scan wrapper architecture for system-on-chip | Physics | 1 | Active |
| US11300741B2 | Leaf shaped intermittent bonded optical fibre ribbon | Physics | 0 | Active |
| US12401349B2 | Single event upset hardened flip-flop and methods of operation | Electricity | 0 | Active |
| US11953749B2 | Intermittently bonded ribbon with colored bonds | Physics | 0 | Active |
| US12032217B2 | Cable with interstitial fillers and edge ribbons | Physics | 0 | Active |
| US10747922B1 | Test circuitry with annularly arranged compressor and decompressor elements | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.