Patent · US Active

Substrate processing method

US8356424B2 · kind B2 · utility

1Cited by
6References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 23, 2010
Grant dateJan 22, 2013
Priority date
Expiry dateJul 23, 2030

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/67225
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A substrate processing method comprises the step of subjecting a substrate to drying processing in at least one of a processing section and an interface, wherein the step of subjecting the substrate to the drying processing comprises the steps of: rotating the substrate at a first rotational speed around an axis perpendicular to the substrate, while holding the substrate horizontally, forming a liquid layer on the substrate in a state where the substrate is rotated at the first rotational speed, gradually and continuously increasing the rotational speed of the substrate to a second rotational speed after the formation of the liquid layer, and starting discharging a gas to the liquid layer on the substrate while the substrate is rotated at the second rotational speed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.