Patent · US Active

Polishing apparatus

US8357029B2 · kind B2 · utility

5Cited by
31References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 9, 2009
Grant dateJan 22, 2013
Priority date
Expiry dateMay 19, 2030

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B37/30
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A polishing apparatus is used for polishing a substrate such as a semiconductor wafer to a flat mirror finish. The polishing apparatus includes a polishing table (100) having a polishing surface (101a), a top ring body (2) configured to hold and press a substrate against the polishing surface (101a), and a retainer ring (3) provided at an outer peripheral portion of the top ring body (2) and configured to press the polishing surface (101a). A fulcrum for receiving a lateral force applied from the substrate to the retainer ring (3) during polishing of the substrate is located above a central portion of the substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.