Probe mark inspection
US8358831B2 · kind B2 · utility
3Cited by
8References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 10, 2009 |
| Grant date | Jan 22, 2013 |
| Priority date | — |
| Expiry date | Mar 30, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30148
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Probe mark inspection involves a recipe based on unique image characteristics or combinations of unique image characteristics. Result images are correlated with a reference created to determine which image characteristic or combination of image characteristics provides an improved contrast.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.