John T. Strom
18Patents
6h-index
9Co-inventors
55Inventor score
Filing activity: Jun 7, 1999 → Jun 18, 2013
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7231081B2 | Stereoscopic three-dimensional metrology system and method | Electricity | 24 | Expired |
| US7634128B2 | Stereoscopic three-dimensional metrology system and method | Electricity | 23 | Active |
| US7634129B2 | Dual-axis scanning system and method | Physics | 14 | Expired |
| US6414477B1 | Method for optimizing probe card analysis and scrub mark analysis data | Physics | 13 | Expired |
| US7170307B2 | System and method of mitigating effects of component deflection in a probe card analyzer | Physics | 9 | Expired |
| US7062091B2 | Coordinate calibration for scanning systems | Physics | 9 | Expired |
| US7960981B2 | Apparatus for obtaining planarity measurements with respect to a probe card analysis system | Physics | 5 | Active |
| US6621262B2 | Method for optimizing probe card analysis and scrub mark analysis data | Physics | 5 | Expired |
| US7385409B2 | System and method of mitigating effects of component deflection in a probe card analyzer | Physics | 4 | Active |
| US7102368B2 | Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis, and manufacture | Physics | 3 | Expired |
| US8358831B2 | Probe mark inspection | Physics | 3 | Active |
| US7579853B2 | Apparatus for obtaining planarity measurements with respect to a probe card analysis system | Physics | 3 | Active |
| US7750622B2 | Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis and manufacture | Physics | 2 | Active |
| US7633306B2 | System and method of measuring probe float | Physics | 1 | Active |
| US8198906B2 | Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis, and manufacture | Physics | 1 | Active |
| US8089292B2 | System and method of measuring probe float | Physics | 0 | Active |
| US9638782B2 | Probe card analysis system and method | Physics | 0 | Active |
| US8466703B2 | Probe card analysis system and method | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.